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University of Balamand > Academics > Research > Seminars > Fadi Daou

BIT Error Rate Testers: Applications and Testing

SUBMITTED BY: Mr. Fadi Daou
CTO of PXIT and President of PXIT Inc

ABSTRACT: This seminar is a technical presentation on the applications of BIT Error Rate Testers, and testing them with MultiGigabit SERDES. In addition, the product that PXIT is planning to develop in Lebanon and the various elements of the SR project will be outlined. Moreover, the company is specifically working with Xilinx FPGA to develop a BERT and this work will also be discussed.
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University of Balamand,
Balamand Al Kurah,
Lebanon

Tel:  +961-6-930250
Fax: +961-6-930278