Skip Ribbon Commands Skip to main content
Help (new window)
University of Balamand > Academics > Research > Seminars > Fadi Daou

BIT Error Rate Testers: Applications and Testing

CTO of PXIT and President of PXIT Inc

ABSTRACT: This seminar is a technical presentation on the applications of BIT Error Rate Testers, and testing them with MultiGigabit SERDES. In addition, the product that PXIT is planning to develop in Lebanon and the various elements of the SR project will be outlined. Moreover, the company is specifically working with Xilinx FPGA to develop a BERT and this work will also be discussed.
facebook    LinkedIn    youTube    Social Media
University of Balamand,
Balamand Al Kurah,

Tel:  +961-6-930250
Fax: +961-6-930278