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University of Balamand > Academics > Research > Seminars > Raoul Velazco

Single Event Effects on Digital Integrated Circuits Part I - Raoul Velazco

Tuesday October 27, 2009 from 12:30 to 14:00 at Jacobo Auditorium

SUBMITTED BY: Raoul Velazco, TIMA Laboratory - ARIS research group
46, Avenue Félix Viallet 38031 Grenoble Cedex - France
raoul.velazco@imag.fr

ABSTRACT: New generation electronic devices have become more and more sensitive to the effects of the natural radiation coming from the surrounding environment. These radiation sources are cosmic rays and radioactive impurities, able to corrupt the content of memory cells or to induce transient pulses in combinational logic. The growing sensitivity seems to be related to two main factors: the lower and lower charge needed to define the logic levels in advanced devices and the increasing number of basic components inside the modern integrated circuits. In this presentation are described state-of-art techniques to mitigate these effects as well as typical tests and experiments to evaluate the sensitivity or the radiation-tolerance of the integrated devices and systems.
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